CHEM5210

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CHEM 5210 - Materials Characterization (4 Cr.)

Chemistry (11098) TIOT - College of Science and Engineering

Course description

Modern tools/techniques for both bulk- and thin-film characterization. Topics may include ion-solid interactions, Rutherford back scattering, secondary ion mass spectrometry, solid-state NMR, x-ray photoelectron spectroscopy, small-angle x-ray/neutron scattering, transmission/scanning electron/probe microscopy, near-field scanning optical microscopy, porosimetry, adsorption techniques, and ellipsometry.

prereq: grad student or instr consent

Minimum credits

4

Maximum credits

4

Is this course repeatable?

No

Grading basis

OPT - Student Option

Lecture

Requirements

000017

Fulfills the writing intensive requirement?

No

Typically offered term(s)

Every Spring