CHEM5210
CHEM 5210 - Materials Characterization (4 Cr.)
Chemistry (11098)
TIOT - College of Science and Engineering
CHEM 5210 - Materials Characterization (4 Cr.)
Course description
Modern tools/techniques for both bulk- and thin-film characterization. Topics may include ion-solid interactions, Rutherford back scattering, secondary ion mass spectrometry, solid-state NMR, x-ray photoelectron spectroscopy, small-angle x-ray/neutron scattering, transmission/scanning electron/probe microscopy, near-field scanning optical microscopy, porosimetry, adsorption techniques, and ellipsometry.
prereq: grad student or instr consent
prereq: grad student or instr consent
Minimum credits
4
Maximum credits
4
Is this course repeatable?
No
Grading basis
OPT - Student Option
Lecture
Requirements
000017
Fulfills the writing intensive requirement?
No
Typically offered term(s)
Every Spring