Patent Law LL.M.
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Law School (TLAW)30L - Master of Laws
Preferred undergraduate degree in a related discipline
Applicants with a degree in Science or Engineering are preferred.
Preferred graduate or professional degree
Applicants must have completed a domestic or international law degree. We encourage applicants with science and technical backgrounds.
Preferred English language test for admission
No Preferred Test
TOEFL - Total - Score
80
IELTS - Total - Score
6.5
Is a Graduate Record Examination (GRE) score used to determine admission to this program?
No
Is a Graduate Management Admission Test (GMAT) score used to determine admission to this program?
No
Is a Law School Admission Test (LSAT) score used to determine admission to this program?
No
Description of other application requirements
Personal statement, resume, letters of recommendation, interview, patent bar eligibility assessment, character and fitness inquiry.
For applicants who take the TOEFL exam before January 20, 2026, the minimum score is 80, with strong preference given to applicants with scores over 100. For applicants who take the TOEFL exam on January 21, 2026, or after, the minimum score is 4.5, with strong preference given to applicants with scores of 5.0 or higher. We do not accept MyBest scores. For applicants who take the IELTS exam, the minimum score is 6.5, with strong preference given to candidates who score 7.5 or higher. Regardless of the exam taken, scores are valid for two years from the test date.
For applicants who take the TOEFL exam before January 20, 2026, the minimum score is 80, with strong preference given to applicants with scores over 100. For applicants who take the TOEFL exam on January 21, 2026, or after, the minimum score is 4.5, with strong preference given to applicants with scores of 5.0 or higher. We do not accept MyBest scores. For applicants who take the IELTS exam, the minimum score is 6.5, with strong preference given to candidates who score 7.5 or higher. Regardless of the exam taken, scores are valid for two years from the test date.